Go to page of
A good user manual
The rules should oblige the seller to give the purchaser an operating instrucion of Dell JSM-6060LV, along with an item. The lack of an instruction or false information given to customer shall constitute grounds to apply for a complaint because of nonconformity of goods with the contract. In accordance with the law, a customer can receive an instruction in non-paper form; lately graphic and electronic forms of the manuals, as well as instructional videos have been majorly used. A necessary precondition for this is the unmistakable, legible character of an instruction.
What is an instruction?
The term originates from the Latin word „instructio”, which means organizing. Therefore, in an instruction of Dell JSM-6060LV one could find a process description. An instruction's purpose is to teach, to ease the start-up and an item's use or performance of certain activities. An instruction is a compilation of information about an item/a service, it is a clue.
Unfortunately, only a few customers devote their time to read an instruction of Dell JSM-6060LV. A good user manual introduces us to a number of additional functionalities of the purchased item, and also helps us to avoid the formation of most of the defects.
What should a perfect user manual contain?
First and foremost, an user manual of Dell JSM-6060LV should contain:
- informations concerning technical data of Dell JSM-6060LV
- name of the manufacturer and a year of construction of the Dell JSM-6060LV item
- rules of operation, control and maintenance of the Dell JSM-6060LV item
- safety signs and mark certificates which confirm compatibility with appropriate standards
Why don't we read the manuals?
Usually it results from the lack of time and certainty about functionalities of purchased items. Unfortunately, networking and start-up of Dell JSM-6060LV alone are not enough. An instruction contains a number of clues concerning respective functionalities, safety rules, maintenance methods (what means should be used), eventual defects of Dell JSM-6060LV, and methods of problem resolution. Eventually, when one still can't find the answer to his problems, he will be directed to the Dell service. Lately animated manuals and instructional videos are quite popular among customers. These kinds of user manuals are effective; they assure that a customer will familiarize himself with the whole material, and won't skip complicated, technical information of Dell JSM-6060LV.
Why one should read the manuals?
It is mostly in the manuals where we will find the details concerning construction and possibility of the Dell JSM-6060LV item, and its use of respective accessory, as well as information concerning all the functions and facilities.
After a successful purchase of an item one should find a moment and get to know with every part of an instruction. Currently the manuals are carefully prearranged and translated, so they could be fully understood by its users. The manuals will serve as an informational aid.
Table of contents for the manual
-
Page 1
JEOL JSM-6060L V SCANNING ELECTR ON MICR OSCOPE Insert Nickname Her e Operating Instr uctions[...]
-
Page 2
JEOL JSM-6060LV SCANNING ELECTRON MICROSCOPE 1 T able of Contents 1 INTRODUCTION Safety 3 2 BACKGROUND Background Inf ormation 4 References 4 3 SAMPLES Sample Holders 7 Sample Preparation 7 4 OPERATION Instrume nt Startup 8 Sample Loading 8 Getting an Image 9 Moving Around 9 Image Scanning 10 Zooming In (or Out) 10 Other Toolbar But tons 10 System [...]
-
Page 3
JEOL JSM-6060LV SCANNING ELECTRON MICROSCOPE 2 Introduction he JEOL JSM-6060LV is a sta te-of-the-art scanning electron microscope that features a low vacuum for observation of non-conductive specimens, a fully automated electron gun, a backscattered electron detector for at omic number contra st imaging, fully integrated digital control, motorized[...]
-
Page 4
JEOL JSM-6060LV SCANNING ELECTRON MICROSCOPE 3 Background The scanning electron microscope (SEM) is one of the most versatile instruments for the examination and analysis of the microstructural ch aracteristics of solids. Although the SEM and optical microscope share the same primary functi on – making microstructura l features and objects visibl[...]
-
Page 5
JEOL JSM-6060LV SCANNING ELECTRON MICROSCOPE 4 Figure 2. Schematic illustration of SEM electron The basic components of a SEM are the vacuum system, electron gun, lens system, electron detector, imaging system, and the electronics asso ciate d with these components. The vacuum system is necessary to minimize the interferen ce of air particles with [...]
-
Page 6
JEOL JSM-6060LV SCANNING ELECTRON MICROSCOPE 5 Samples he JEOL JSM-6060LV in stan dard high vacuum operatin g mode can handle a variety of sample types. The low vacuum mode enables the instrument to handle non- conductive samples, including organic materia ls (polymers, etc.), ceramics and glasses, and biological samples. Sample Holder s Please use[...]
-
Page 7
JEOL JSM-6060LV SCANNING ELECTRON MICROSCOPE 6 2. Remove excess lint, dust, moisture, and other debr is from your specimen, unless you want to examine those things. 3. Use the sputter coater to create a conductive gold coating on the surface of your sample. See separate operating instructions for the sputter coater. 4. After coating your sample, us[...]
-
Page 8
JEOL JSM-6060LV SCANNING ELECTRON MICROSCOPE 7 Instrument Operation his section will walk you through the basic operation of the scanning electron microscope. You will follow a se ries of t asks that includes • Powering up the instrument, • Loadin g your sample, • Evacuating the chamber, • Turning on the electron gun, and • Gazing at some[...]
-
Page 9
JEOL JSM-6060LV SCANNING ELECTRON MICROSCOPE 8 6. Close the chamber door by gently pushing it fo rward until it stops. 7. Press and hold the EVAC button (on the front of the instrument) until it lights up green. 8. WAIT for evacuation of the chamber (about 1 minut e). While you’re wait ing, go to the next section – Software. Getting an Image 1.[...]
-
Page 10
JEOL JSM-6060LV SCANNING ELECTRON MICROSCOPE 9 3. Tilt. Turn the knob at the lower right side of the chamber d oor assembly to tilt your specimen. BE CAREF UL when adjusting the sample tilt – you don’t want to run your sample into anything inside the column. 4. Height . Sample height may be changed by manual ly adjusting the y-axis position kno[...]
-
Page 11
JEOL JSM-6060LV SCANNING ELECTRON MICROSCOPE 10 Photography cquiring an image from the SEM is relative ly easy, but there are quite a few options for live image scanning and corresponding image resolution. This section outlines several options for acquiring digita l images of different resolutions, and it provides a few general tips fo r good SEM p[...]
-
Page 12
JEOL JSM-6060LV SCANNING ELECTRON MICROSCOPE 11 4. Once the image is frozen, click the Save button above the image, select a save directory, type a filename, select a fi le format, and click Save . Higher R esolution (slow er) Photos 1. Press the green Scan2 button on the toolbar. 2. Carefully adjust the focus and stigmation settings at a higher ma[...]